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1

In Search of Pelasgian Ancestors. The 1861 Hungarian Excavations in the Apenninesby János György Szilágyi; Péter Agócs

Review by: Jean Gran-Aymerich

Journal:

Année:

2006

Fichier:

PDF, 438 KB

2006

2

Trapped charge and stress induced leakage current (SILC) in tunnel SiO2 layers of de-processed MOS non-volatile memory devices observed at the nanoscale

M. Lanza, M. Porti, M. Nafría, X. Aymerich, G. Ghidini, A. Sebastiani

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 443 KB

english, 2009

3

[WORLD SCIENTIFIC Proceedings of the MS'10 International Conference - Barcelona, Spain (15–17 July 2010)] Computational Intelligence in Business and Economics - THE OPTIMIZATION OF INVESTMENT IN POS ADVERTISING THROUGH A FUZZY MODEL BASED ON THE APPLICATION OF NEUROMARKETING TECHNIQUES

GIL-LAFUENTE, JAIME, TORTOSA VIDAL, JOSEP MARIA, AYMERICH MARTINEZ, JORDI

Langue:

english

Fichier:

PDF, 136 KB

english

4

Response of notched carbon/PEEK and carbon/epoxy laminates subjected to tension fatigue loading

F. Aymerich, M. S. Found

Journal:

Fatigue & Fracture of Engineering Materials & Structures

Année:

2000

Langue:

english

Fichier:

PDF, 367 KB

english, 2000

5

Carrier transport and storage in Si3N4 for metal-nitride-oxide-semiconductor memory applications

F. Martín, X. Aymerich, F. Campabadal, M.C. Acero

Journal:

Thin Solid Films

Année:

1992

Langue:

english

Fichier:

PDF, 925 KB

english, 1992

6

Characterization of the spatial distribution of traps in Si3N4 by field-assisted discharge of metal-nitride-oxide-semiconductor devices

F. Martín, X. Aymerich

Journal:

Thin Solid Films

Année:

1992

Langue:

english

Fichier:

PDF, 640 KB

english, 1992

7

Damage response of stitched cross-ply laminates under impact loadings

F. Aymerich, C. Pani, P. Priolo

Journal:

Engineering Fracture Mechanics

Année:

2007

Langue:

english

Fichier:

PDF, 2.26 MB

english, 2007

8

Influence of oxide breakdown position and device aspect ratio on MOSFET’s output characteristics

R. Fernández, R. Rodrı́guez, M. Nafrı́a, X. Aymerich

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 117 KB

english, 2005

9

Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs

J. Martín-Martínez, S. Gerardin, R. Rodríguez, M. Nafría, X. Aymerich, A. Cester, A. Paccagnella, G. Ghidini

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 634 KB

english, 2007

10

SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors

J. Martin-Martinez, E. Amat, M.B. Gonzalez, P. Verheyen, R. Rodríguez, M. Nafría, X. Aymerich, E. Simoen

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 504 KB

english, 2010

11

Assessment of NDT interferometric techniques for impact damage detection in composite laminates

R. Ambu, F. Aymerich, F. Ginesu, P. Priolo

Journal:

Composites Science and Technology

Année:

2006

Langue:

english

Fichier:

PDF, 370 KB

english, 2006

12

FinFET and MOSFET preliminary comparison of gate oxide reliability

R. Fernández, R. Rodríguez, M. Nafría, X. Aymerich, B. Kaczer, G. Groeseneken

Journal:

Microelectronics Reliability

Année:

2006

Langue:

english

Fichier:

PDF, 286 KB

english, 2006

13

Influence of a low field with opposite polarity to the stress on the degradation of 4.5 nm thick SiO2 films

R. Rodrı́guez, M. Porti, M. Nafrı́a, X. Aymerich

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 129 KB

english, 2001

14

Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope

M Porti, X Blasco, M Nafrı́a, X Aymerich, A Olbrich, B Ebersberger

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 143 KB

english, 2001

15

Characterising the surface roughness of AFM grown SiO2 on Si

D. Hill, X. Blasco, M. Porti, M. Nafrı́a, X. Aymerich

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 256 KB

english, 2001

16

Two-step stress method for the dynamic testing of very thin (8 nm) SiO2 films

R. Rodríguez, E. Miranda, M. Nafría, J. Suñé, X. Aymerich

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 376 KB

english, 1998

17

Switching events in the soft breakdown I–t characteristic of ultra-thin SiO2 layers

E Miranda, J Suñé, R Rodrı́guez, M Nafrı́a, X Aymerich

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 150 KB

english, 1999

18

Relation between defect generation, stress induced leakage current and soft breakdown in thin (

R Rodrı́guez, E Miranda, R Pau, J Suñé, M Nafrı́a, X Aymerich

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 153 KB

english, 2000

19

A common framework for soft and hard breakdown in ultrathin oxides based on the theory of point contact conduction

E Miranda, J Suñé, R Rodríguez, M Nafría, X Aymerich

Journal:

Microelectronic Engineering

Année:

1999

Langue:

english

Fichier:

PDF, 309 KB

english, 1999

20

Breakdown spots of ultra-thin (EOT 

X. Blasco, M. Nafrı́a, X. Aymerich, J. Pétry, W. Vandervorst

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 235 KB

english, 2005

21

Model-independent determination of the degradation dynamics of thin SiO2 films

R. Rodríguez, M. Nafría, E. Miranda, J. Suñé, X. Aymerich

Journal:

Microelectronics Reliability

Année:

1999

Langue:

english

Fichier:

PDF, 323 KB

english, 1999

22

Conduction properties of breakdown paths in ultrathin gate oxides

E Miranda, J Suñé, R Rodrı́guez, M Nafrı́a, X Aymerich

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 161 KB

english, 2000

23

Simultaneous detection of Listeria monocytogenes and Salmonella by multiplex PCR in cooked ham

A. Jofré, B. Martin, M. Garriga, M. Hugas, M. Pla, D. Rodrı́guez-Lázaro, T. Aymerich

Journal:

Food Microbiology

Année:

2005

Langue:

english

Fichier:

PDF, 301 KB

english, 2005

24

The search for a role of the caudal intralaminar nuclei in the pathophysiology of Parkinson’s disease

José L. Lanciego, Icíar P. López, Alberto J. Rico, María S. Aymerich, Mónica Pérez-Manso, Lorena Conte, Carolina Combarro, Elvira Roda, Carmen Molina, Nancy Gonzalo, María Castle, Teresa Tuñón, Elena

Journal:

Brain Research Bulletin

Année:

2009

Langue:

english

Fichier:

PDF, 371 KB

english, 2009

25

Decontamination technologies for meat products

T. Aymerich, P.A. Picouet, J.M. Monfort

Journal:

Année:

2008

Langue:

english

Fichier:

PDF, 376 KB

english, 2008

26

Nanoscale observations of resistive switching high and low conductivity states on TiN/HfO2/Pt structures

V. Iglesias, M. Lanza, A. Bayerl, M. Porti, M. Nafría, X. Aymerich, L.F. Liu, J.F. Kang, G. Bersuker, K. Zhang, Z.Y. Shen

Journal:

Microelectronics Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 894 KB

english, 2012

27

Channel Hot-Carrier Degradation in Short-Channel Transistors With High- $k$/Metal Gate Stacks

Amat, E., Kauerauf, T., Degraeve, R., De Keersgieter, A., Rodriguez, R., Nafria, M., Aymerich, X., Groeseneken, G.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 287 KB

english, 2009

28

Finite element modelling of damage induced by low-velocity impact on composite laminates

Feng, D., Aymerich, F.

Journal:

Composite Structures

Année:

2014

Langue:

english

Fichier:

PDF, 813 KB

english, 2014

29

RELAB: a tool to include MOSFETs variability, BTI aging and dielectric breakdown in SPICE simulators

Martin-Martinez, J., Moras, M., Rodriguez, R., Nafria, M., Aymerich, X.

Journal:

Analog Integrated Circuits and Signal Processing

Année:

2014

Langue:

english

Fichier:

PDF, 1.53 MB

english, 2014

30

New Weighted Time Lag Method for the Analysis of Random Telegraph Signals

Martin-Martinez, Javier, Diaz, Javier, Rodriguez, Rosana, Nafria, Montserrat, Aymerich, Xavier

Journal:

IEEE Electron Device Letters

Année:

2014

Langue:

english

Fichier:

PDF, 1.11 MB

english, 2014

31

General model pseudopotential: Binary compounds

Aymerich, F., Meloni, F., Mula, G.

Journal:

Physical Review B

Année:

1977

Langue:

english

Fichier:

PDF, 384 KB

english, 1977

32

Negative Bias Temperature Instabilities induced in devices with millisecond anneal for ultra-shallow junctions

Moras, M., Martin-Martinez, J., Rodriguez, R., Nafria, M., Aymerich, X., Simoen, E.

Journal:

Solid-State Electronics

Année:

2014

Langue:

english

Fichier:

PDF, 1.44 MB

english, 2014

33

Sustainable Wild Harvesting of A rctostaphylos uva-ursi in the Pyrenees as a Conservation Practice

Recasens, J., Ninot, P., Cristóbal, R., Aymerich, P.

Journal:

Journal of Herbs Spices & Medicinal Plants

Année:

2008

Langue:

english

Fichier:

PDF, 333 KB

english, 2008

34

Gate Voltage Influence on the Channel Hot-Carrier Degradation of High-$k$ -Based Devices

Amat, Esteve, Kauerauf, Thomas, Degraeve, Robin, Rodriguez, Rosana, Nafria, Montserrat, Aymerich, Xavier, Groeseneken, Guido

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 363 KB

english, 2011

35

Presence and Emotions in Playing a Group Game in a Virtual Environment: The Influence of Body Participation

Aymerich-Franch, Laura

Journal:

Cyberpsychology Behavior and Social Networking

Année:

2010

Langue:

english

Fichier:

PDF, 180 KB

english, 2010

36

[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC Source/Drain

Amat, E., Rodriguez, R., Gonzalez, M.B., Martin-Martinez, J., Nafria, M., Aymerich, X., Machkaoutsan, V., Bauer, M., Verheyen, P., Simoen, E.

Année:

2010

Langue:

english

Fichier:

PDF, 338 KB

english, 2010

37

What is Abstinence? Definitions and Examples of Abstinence, to Prevent the Sexual Transmission of the HIV Virus, According to Spanish University Students

Planes, Montserrat, Gómez, Ana B, Gras, Eugenia, Sullman, Mark J, Font-Mayolas, Sílvia, Cunill, Mónica, Aymerich, Maria

Journal:

Behaviour Change

Année:

2009

Langue:

english

Fichier:

PDF, 279 KB

english, 2009

38

Confirmatory Factor Analysis Compared with Principal Component Analysis to Derive Dietary Patterns: A Longitudinal Study in Adult Women

Bedard, A., Garcia-Aymerich, J., Sanchez, M., Le Moual, N., Clavel-Chapelon, F., Boutron-Ruault, M.-C., Maccario, J., Varraso, R.

Journal:

Journal of Nutrition

Année:

2015

Langue:

english

Fichier:

PDF, 806 KB

english, 2015

39

Debate: La afectividad en la vejez

J. M.a MASRIERA SAGALÉS, CARMEN AYMERICH, MANUEL BELTRÁN FLÓREZ and JOSEP MARIA DEXEUS

Journal:

Année:

1988

Fichier:

PDF, 1.14 MB

1988

40

Physical Activity and Its Determinants in Severe Chronic Obstructive Pulmonary Disease

GARCIA-AYMERICH, JUDITH, FÉLEZ, MIQUEL A, ESCARRABILL, JOAN, MARRADES, RAMON M., MORERA, JOSEP, ELOSUA, ROBERTO, ANTÓ, JOSEP M.

Journal:

Medicine & Science in Sports & Exercise

Année:

2004

Langue:

english

Fichier:

PDF, 188 KB

english, 2004

41

Más Allá de la Imagen || Historia, testimonio y nueva novela latinoamericana. Biografía de un cimarron

Carmen Ochando Aymerich

Journal:

Historia, Antropología y Fuentes Orales

Année:

1998

Fichier:

PDF, 1.02 MB

1998

42

Assessing the Scaling Subtraction Method for Impact Damage Detection in Composite Plates

Porcu, Maria Cristina, Pieczonka, Lukasz, Frau, Andrea, Staszewski, Wieslaw Jerzy, Aymerich, Francesco

Journal:

Journal of Nondestructive Evaluation

Année:

2017

Langue:

english

Fichier:

PDF, 3.39 MB

english, 2017

43

Object Touch by a Humanoid Robot Avatar Induces Haptic Sensation in the Real Hand

Aymerich-Franch, Laura, Petit, Damien, Ganesh, Gowrishankar, Kheddar, Abderrahmane

Journal:

Journal of Computer-Mediated Communication

Année:

2017

Langue:

english

Fichier:

PDF, 1.34 MB

english, 2017

44

Cognitive Therapy for Dementia Patients: A Systematic Review

Carrion, Carme, Folkvord, Frans, Anastasiadou, Dimitra, Aymerich, Marta

Journal:

Dementia and Geriatric Cognitive Disorders

Année:

2018

Langue:

english

Fichier:

PDF, 431 KB

english, 2018

45

Reversible dielectric breakdown of thin gate oxides in MOS devices

J. Suñé, M. Nafría, X. Aymerich

Journal:

Microelectronics Reliability

Année:

1993

Langue:

english

Fichier:

PDF, 493 KB

english, 1993

46

High field dynamic stress of thin SiO2 films

M. Nafría, J. Suñé, D. Yélamos, X. Aymerich

Journal:

Microelectronics Reliability

Année:

1995

Langue:

english

Fichier:

PDF, 600 KB

english, 1995

47

Breakdown of thin gate silicon dioxide films—A review

M. Nafría, J. Suñé, X. Aymerich

Journal:

Microelectronics Reliability

Année:

1996

Langue:

english

Fichier:

PDF, 1.41 MB

english, 1996

48

Charge distribution and chemical bonding in CdGeP2 and CdGeAs2

M. Serra, F. Aymerich, F. Meloni, G.G. Pegna

Journal:

Solid State Communications

Année:

1984

Langue:

english

Fichier:

PDF, 232 KB

english, 1984

49

On the breakdown statistics of very thin SiO2 films

J. Suñé, I. Placencia, N. Barniol, E. Farrés, F. Martín, X. Aymerich

Journal:

Thin Solid Films

Année:

1990

Langue:

english

Fichier:

PDF, 865 KB

english, 1990

50

After-breakdown conduction through ultrathin SiO2 films in metal/insulator/semiconductor structures

J. Suñe, E. Farrés, X. Aymerich

Journal:

Thin Solid Films

Année:

1991

Langue:

english

Fichier:

PDF, 961 KB

english, 1991